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Showing results: 211 - 225 of 256 items found.

  • Data Acquisition Systems

    LMS SCADAS - Siemens Digital Industries Software

    The LMS SCADAS state-of-the-art data acquisition systems cover all types of noise, vibration, durability testing and engineering tasks in the lab, in the field, with a PC or through autonomous recording. Seamless integration with LMS Test.Lab and LMS Test.Xpress provides you with reliable results and optimal testing productivity. Take your mind off the deadline and focus on the test. From lab to mobile to portable.

  • NI LabVIEW Base Development System for Windows

    NI

    NLabVIEW is system engineering software designed for applications that require test, measurement, and control with rapid access to hardware and data insights. The LabVIEW Base Development System is recommended to integrate NI hardware and third-party devices together to build automated desktop measurement applications with an intuitive graphical programming syntax.For applications that require advanced inline analysis or PID control, consider LabVIEW Full Development System.

  • High Voltage Test & Measurement System

    NEO TELE-TRONIX PVT. LTD

    Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.

  • AMIDA 5000 Tester

    Amida Technology, Inc.

    AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.

  • HV Test Load Systems

    B-1025-1 - ROSS ENGINEERING CORPORATION

    Design and manufacture of electronic and electromechanical devices and systems for our customers' special applications has been Ross Engineering Corporation's specialty for 44 years. Among these devices are our High Voltage Test Loads and Resistance/Capacitance Networks designed to simulate radar, communication, and television transmitter loads for testing up to 300kV DC or AC and 200kW. For example, one Test Load System required 4 separate simulated load networks to complete an 8kV, 14kV, 24/6kV, and 34kV high voltage testing system.

  • Test Solutions For Integrators

    Testek Solutions

    Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.

  • L.V. Power Capacitors

    Entes Elektronik

    LV power capacitors are circuit elements which compensate the inductive reactive loads on a system. Being able to connect and disconnect up to 100 times a day in accordance with load variations in automatic reactive power compensation systems really speaks for the quality and endurance and capacitors. Upon connection/disconnection instances, currents which have higher values than the nominal value may occur on reactive power compensation capacitors. ENTES ENT.C series power capacitors are designed to withstand the severe and poor conditions which may shorten the operating life during reactive power compensation. This endurance is the result of advanced engineering and long-term test procedures.

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • Tensile Properties of Thin Plastic Sheeting

    ASTM D882 - National Technical Systems

    This test method covers the determination of tensile properties of plastics in the form of thin sheeting and films (less than 1.0 mm (0.04 in.) in thickness). Film is defined in Terminology D883 as an optional term for sheeting having a nominal thickness no greater than 0.25 mm (0.010 in.). Tensile properties of plastics 1.0 mm (0.04 in.) or greater in thickness shall be determined according to Test Method D638. This test method can be used to test all plastics within the thickness range described and the capacity of the machine employed. Specimen extension can be measured by grip separation, extension indicators, or displacement of gage marks. The procedure for determining the tensile modulus of elasticity is included at one strain rate. The modulus determination is generally based on the use of grip separation as a measure of extension; however, the desirability of using extensometers, is recognized and provision for the use of such instrumentation is incorporated in the procedure. Test data obtained by this test method is relevant and appropriate for use in engineering design. The values stated in SI units are to be regarded as the standard. The values in parentheses are provided for information only. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

  • Debug Fixture

    IST Engineering, INC.

    With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.

  • Portable Ultrasonic Flaw Detector

    MFD500B - Rinch Industrial Co.,Limited

    Mfd500b portable ultrasonic flaw detector adopte the international advanced ic technique and new-style color tft lcd display. Its each performance index all arrive or even beyond international excellence. The instrument use the artificial intelligence technology. It has very strong function and can be used very convenient. Mfd500b can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in worklpiece’s interior swiftly and accurately without any destruction. It can not only be used in lab but also can be used on engineering site. Also, it can be widely used for safety checking and life evaluating in fields of aeronautics, rail transportation and boiler pressure vessel.

  • Test Data Investment Services

    PDF Solutions

    PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development

  • Ultrasonic Flaw Detector

    MFD350B - Mitech Co., LTD.

    Based on ultrasonic principle, digital ultrasonic flaw detector MFD350B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-6000mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.

  • Ultrasonic Flaw Detector

    MFD500B - Mitech Co., LTD.

    Based on ultrasonic principle, digital ultrasonic flaw detector MFD500B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-9999mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.

  • Bench Digital Multimeter, Calibrated, 1 kV, 10 A, 3.8 Digit

    72-1015 CAL - Tenma

    The 72-1015 CAL from Tenma is a digital bench type true RMS multimeter. It has auto and manual range options with maximum reading of 5999 counts and 3-5/6 digits which has a unique outlook design. In addition to all the conventional features including DC/AC voltage, current, resistance, diode, continuity test, diode test capacitance, temperature, transistor, max/min, there is a data hold, low battery display, sleep mode, RS232C serial port for easy connection with computer to realize macro recording, monitoring and capture of transient dynamic data, displaying change of waveform during the measurement, providing data and evidence to engineering technicians for scientific research. This meter complies with the standards IEC61010, pollution degree 2, overvoltage category (CAT I 1000V, CAT II 600V) double insulation and CE marked.

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